"Comparison of Impedance Matching Networks for Scanning Microwave Microscopy."

Johannes Hoffmann et al. (2024)

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DOI: 10.1109/TIM.2024.3378310

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type: Journal Article

metadata version: 2024-05-31

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Johannes Hoffmann, Sophie De Préville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Théron, Georg Gramse, Damien Richert, José Morán-Meza, François Piquemal:
Comparison of Impedance Matching Networks for Scanning Microwave Microscopy. IEEE Trans. Instrum. Meas. 73: 1-9 (2024)

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