"Measurement Capability of Scanning Microwave Microscopy: Measurement ..."

Masahiro Horibe, Seitaro Kon, Iku Hirano (2019)

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DOI: 10.1109/TIM.2018.2882937

access: closed

type: Journal Article

metadata version: 2022-01-03

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Masahiro Horibe, Seitaro Kon, Iku Hirano:
Measurement Capability of Scanning Microwave Microscopy: Measurement Sensitivity Versus Accuracy. IEEE Trans. Instrum. Meas. 68(6): 1774-1780 (2019)

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