"A Test Response Compression Method for Monolithic 3-D ICs Based on 3-D ..."

Jing Hu et al. (2021)

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DOI: 10.1109/TIM.2020.3042319

access: closed

type: Journal Article

metadata version: 2021-01-11

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Jing Hu, Yuheng Lin, Ming Hu, Hongjian Wang:
A Test Response Compression Method for Monolithic 3-D ICs Based on 3-D Haar Wavelet Transforms. IEEE Trans. Instrum. Meas. 70: 1-12 (2021)

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