"Open-structure resonant technique for measuring the dielectric properties ..."

William R. Humbert, Waymond R. Scott Jr. (1998)

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DOI: 10.1109/19.744321

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type: Journal Article

metadata version: 2020-06-08

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William R. Humbert, Waymond R. Scott Jr.:
Open-structure resonant technique for measuring the dielectric properties of materials. IEEE Trans. Instrum. Meas. 47(3): 666-673 (1998)

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