"Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems."

Byoungjae Jin et al. (2003)

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DOI: 10.1109/TIM.2003.818735

access: closed

type: Journal Article

metadata version: 2020-06-08

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Byoungjae Jin, Nohpill Park, Kayikkalthop M. George, Minsu Choi, Mark B. Yeary:
Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems. IEEE Trans. Instrum. Meas. 52(6): 1713-1721 (2003)

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