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"Low-Contact Resistance Probe Card Using MEMS Technology."

Nabeeh Kandalaft, Iftekhar Ibne Basith, Rashid Rashidzadeh (2014)

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DOI: 10.1109/TIM.2014.2321461

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - journals/tim/KandalaftBR14
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  - https://dblp.org/rec/journals/tim/KandalaftBR14
Nabeeh Kandalaft, Iftekhar Ibne Basith, Rashid Rashidzadeh:
Low-Contact Resistance Probe Card Using MEMS Technology. IEEE Trans. Instrum. Meas. 63(12): 2882-2889 (2014)

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