"Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe ..."

Nguyen Ngoc Mai Khanh et al. (2018)

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DOI: 10.1109/TIM.2017.2789038

access: closed

type: Journal Article

metadata version: 2020-06-08

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  - https://dblp.org/rec/journals/tim/KhanhNIMA18
Nguyen Ngoc Mai Khanh, Shigeru Nakajima, Tetsuya Iizuka, Yoshio Mita, Kunihiro Asada:
Noninvasive Localization of IGBT Faults by High-Sensitivity Magnetic Probe With RF Stimulation. IEEE Trans. Instrum. Meas. 67(4): 745-753 (2018)

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