"Test Setup for Dynamic ON-State Resistance Measurement of High- and ..."

Benedikt Kohlhepp et al. (2020)

> Home

Details and statistics

DOI: 10.1109/TIM.2020.2985186

access: closed

type: Journal Article

metadata version: 2020-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/KohlheppKTHD20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/KohlheppKTHD20
Benedikt Kohlhepp, Daniel Kübrich, Marvin Tannhäuser, Andreas Hoffmann, Thomas Dürbaum:
Test Setup for Dynamic ON-State Resistance Measurement of High- and Low-Voltage GaN-HEMTs Under Hard and Soft Switching Operations. IEEE Trans. Instrum. Meas. 69(10): 7740-7751 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.