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"Analysis and measurement of timing jitter induced by radiated EMI noise in ..."
Young-Jun Lee et al. (2003)
- Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max:
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. IEEE Trans. Instrum. Meas. 52(6): 1749-1755 (2003)
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