"Research on Transient Temperature Rise Measurement Method for ..."

Xianwei Meng et al. (2023)

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DOI: 10.1109/TIM.2023.3239625

access: closed

type: Journal Article

metadata version: 2023-03-15

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Xianwei Meng, Meng Zhang, Kun Duan, Xiang Zheng, Yuwei Zhai, Shiwei Feng, Yamin Zhang:
Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection. IEEE Trans. Instrum. Meas. 72: 1-9 (2023)

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