"Comparator-based measurement scheme for dark-count rates in single photon ..."

Christian P. Morath et al. (2005)

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DOI: 10.1109/TIM.2005.853347

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type: Journal Article

metadata version: 2020-06-08

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Christian P. Morath, Kenneth Vaccaro, Walter Buchwald, William R. Clark:
Comparator-based measurement scheme for dark-count rates in single photon avalanche diodes. IEEE Trans. Instrum. Meas. 54(5): 2020-2026 (2005)

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