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"High-Throughput Apparatus for Semiconductor Device Characterization in a ..."

Hesham Okeil, Gabriele Schrag, Gerhard K. M. Wachutka (2023)

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DOI: 10.1109/TIM.2023.3315424

access: closed

type: Journal Article

metadata version: 2023-10-27

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Hesham Okeil, Gabriele Schrag, Gerhard K. M. Wachutka:
High-Throughput Apparatus for Semiconductor Device Characterization in a Magnetic Field at Extreme High Temperatures. IEEE Trans. Instrum. Meas. 72: 1-8 (2023)

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