"Introducing a Thermal-Based Method for Measuring Dynamic Thin Film ..."

Gilles Oudebrouckx et al. (2021)

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DOI: 10.1109/TIM.2020.3033444

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type: Journal Article

metadata version: 2023-02-24

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Gilles Oudebrouckx, Thijs Vandenryt, Philippe Nivelle, Seppe Bormans, Patrick H. Wagner, Ronald Thoelen:
Introducing a Thermal-Based Method for Measuring Dynamic Thin Film Thickness in Real Time as a Tool for Sensing Applications. IEEE Trans. Instrum. Meas. 70: 1-10 (2021)

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