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"A Test Structure for the EMC Characterization of Small Integrated Circuits."

Michele Perotti, Franco Fiori (2018)

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DOI: 10.1109/TIM.2018.2800238

access: closed

type: Journal Article

metadata version: 2020-06-08

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Michele Perotti, Franco Fiori:
A Test Structure for the EMC Characterization of Small Integrated Circuits. IEEE Trans. Instrum. Meas. 67(6): 1461-1469 (2018)

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