"On-Chip Thermal Testing Using MOSFETs in Weak Inversion."

Ferran Reverter, Josep Altet (2015)

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DOI: 10.1109/TIM.2014.2341371

access: closed

type: Journal Article

metadata version: 2020-06-08

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Ferran Reverter, Josep Altet:
On-Chip Thermal Testing Using MOSFETs in Weak Inversion. IEEE Trans. Instrum. Meas. 64(2): 524-532 (2015)

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