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"Electrooptical measurement system for the DC characterization of visible ..."

Elisenda Roca et al. (1998)

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DOI: 10.1109/19.744198

access: closed

type: Journal Article

metadata version: 2020-06-08

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Elisenda Roca, Fabián Frutos, Servando Espejo-Meana, Rafael Domínguez-Castro, Ángel Rodríguez-Vázquez:
Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips. IEEE Trans. Instrum. Meas. 47(2): 499-506 (1998)

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