"Why are nonlinear microwave systems measurements so involved?"

Yves Rolain et al. (2004)

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DOI: 10.1109/TIM.2004.827297

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type: Journal Article

metadata version: 2020-06-08

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Yves Rolain, Wendy Van Moer, Gerd Vandersteen, Johan Schoukens:
Why are nonlinear microwave systems measurements so involved? IEEE Trans. Instrum. Meas. 53(3): 726-729 (2004)

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