"Metrological Traceability for the Impedance of Coaxial Devices Using an ..."

James Skinner et al. (2025)

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DOI: 10.1109/TIM.2025.3563005

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type: Journal Article

metadata version: 2025-06-11

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James Skinner, Murat Celep, Stephen Protheroe, Nick E. Fletcher, Nick M. Ridler:
Metrological Traceability for the Impedance of Coaxial Devices Using an LCR Meter. IEEE Trans. Instrum. Meas. 74: 1-9 (2025)

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