"Special issue on BIT CMOS built-in test architecture for high-speed jitter ..."

Karen Taylor et al. (2005)

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DOI: 10.1109/TIM.2005.847348

access: closed

type: Journal Article

metadata version: 2020-06-08

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Karen Taylor, Bryan Nelson, Alan Chong, Henry C. Lin, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz:
Special issue on BIT CMOS built-in test architecture for high-speed jitter measurement. IEEE Trans. Instrum. Meas. 54(3): 975-987 (2005)

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