"A cost-effective wafer-level reliability test system for integrated ..."

Summer Fan-Chung Tseng et al. (2003)

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DOI: 10.1109/TIM.2003.818543

access: closed

type: Journal Article

metadata version: 2020-06-08

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Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai:
A cost-effective wafer-level reliability test system for integrated circuit makers. IEEE Trans. Instrum. Meas. 52(5): 1458-1467 (2003)

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