"RFID Test Platform: Nonlinear Characterization."

Gianfranco Andia Vera, Yvan Duroc, Smail Tedjini (2014)

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DOI: 10.1109/TIM.2014.2307754

access: closed

type: Journal Article

metadata version: 2022-04-09

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Gianfranco Andia Vera, Yvan Duroc, Smail Tedjini:
RFID Test Platform: Nonlinear Characterization. IEEE Trans. Instrum. Meas. 63(9): 2299-2305 (2014)

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