"Multiscale Profile Characterization Based on Atomic Force Microscopy."

Kaixuan Wang et al. (2025)

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DOI: 10.1109/TIM.2025.3548802

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type: Journal Article

metadata version: 2025-05-09

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Kaixuan Wang, Dingyi Wang, Jian Sun, Jialin Shi, Peng Yu, Chanmin Su, Lianqing Liu:
Multiscale Profile Characterization Based on Atomic Force Microscopy. IEEE Trans. Instrum. Meas. 74: 1-9 (2025)

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