"Investigations of noise in measurements of electronic voltage standards."

Thomas J. Witt, Yi-Hua Tang (2005)

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DOI: 10.1109/TIM.2004.843096

access: closed

type: Journal Article

metadata version: 2020-06-08

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Thomas J. Witt, Yi-Hua Tang:
Investigations of noise in measurements of electronic voltage standards. IEEE Trans. Instrum. Meas. 54(2): 567-570 (2005)

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