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"A Defect Inspection for Explosive Cartridge Using an Improved Visual ..."
Liang Xu et al. (2020)
- Liang Xu, Haibo Xu, Xiuxi Li, Ming Pan:
A Defect Inspection for Explosive Cartridge Using an Improved Visual Attention and Image-Weighted Eigenvalue. IEEE Trans. Instrum. Meas. 69(4): 1191-1204 (2020)
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