"Methods of Handling the Tolerance and Test-Point Selection Problem for ..."

Chenglin Yang et al. (2011)

> Home

Details and statistics

DOI: 10.1109/TIM.2010.2050356

access: closed

type: Journal Article

metadata version: 2020-06-08

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tim/YangTLC11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tim/YangTLC11
Chenglin Yang, Shulin Tian, Bing Long, Fang Chen:
Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis. IEEE Trans. Instrum. Meas. 60(1): 176-185 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.