"Dual Feature-Integration Network for Faster and More Pragmatic Few-Shot ..."

He Zhang et al. (2025)

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DOI: 10.1109/TIM.2025.3598394

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type: Journal Article

metadata version: 2025-09-06

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He Zhang, Han Liu, Runyuan Guo, Chengyang Zheng, Qing Liu, Lili Liang, Wenlu Ma, Ding Liu, Youmin Zhang:
Dual Feature-Integration Network for Faster and More Pragmatic Few-Shot Strip Steel Surface Defect Classification. IEEE Trans. Instrum. Meas. 74: 1-18 (2025)

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