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"A Novel Measurement Method for Material Emissivity Under High Temperature."
Jiu Zhang et al. (2025)
- Jiu Zhang
, Xu Lan
, Runxun Ma
, Feng Yue
, Guohui Mei
:
A Novel Measurement Method for Material Emissivity Under High Temperature. IEEE Trans. Instrum. Meas. 74: 1-6 (2025)

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