"A novel prognostic method for degrading devices with nonlinear degradation ..."

Jianfei Zheng et al. (2025)

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DOI: 10.1177/01423312241259821

access: closed

type: Journal Article

metadata version: 2025-03-03

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  - https://dblp.org/rec/journals/tinstmc/ZhengGHPZ25
Jianfei Zheng, Xinyue Geng, Changhua Hu, Hong Pei, Zhengxin Zhang:
A novel prognostic method for degrading devices with nonlinear degradation processes indexed by both continuous and discrete time scales. Trans. Inst. Meas. Control 47(4): 781-794 (2025)

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