"Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield ..."

François Aguet, Dimitri Van De Ville, Michael Unser (2008)

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DOI: 10.1109/TIP.2008.924393

access: closed

type: Journal Article

metadata version: 2023-11-12

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François Aguet, Dimitri Van De Ville, Michael Unser:
Model-Based 2.5-D Deconvolution for Extended Depth of Field in Brightfield Microscopy. IEEE Trans. Image Process. 17(7): 1144-1153 (2008)

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