"Hyperspectral Texture Metrology Based on Distance Measures in an ..."

Rui Jian Chu, Jie Chen, Susanto Rahardja (2025)

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DOI: 10.1109/TIP.2025.3608667

access: closed

type: Journal Article

metadata version: 2025-11-09

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Rui Jian Chu, Jie Chen, Susanto Rahardja:
Hyperspectral Texture Metrology Based on Distance Measures in an Information-Theoretic Framework. IEEE Trans. Image Process. 34: 6331-6346 (2025)

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