"Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection."

Yunfan Ye et al. (2023)

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DOI: 10.1109/TIP.2023.3289296

access: closed

type: Journal Article

metadata version: 2023-11-28

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Yunfan Ye, Renjiao Yi, Zhirui Gao, Zhiping Cai, Kai Xu:
Delving Into Crispness: Guided Label Refinement for Crisp Edge Detection. IEEE Trans. Image Process. 32: 4199-4211 (2023)

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