"Using computer theory to detect PCB defects in an IoT environment."

Long Gao, Fen Zheng, Jian Yong Bian (2022)

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DOI: 10.1007/S11227-022-04610-4

access: closed

type: Journal Article

metadata version: 2022-11-09

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Long Gao, Fen Zheng, Jian Yong Bian:
Using computer theory to detect PCB defects in an IoT environment. J. Supercomput. 78(17): 18887-18914 (2022)

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