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ORCID"Using computer theory to detect PCB defects in an IoT environment."
Long Gao, Fen Zheng, Jian Yong Bian (2022)
- Long Gao, Fen Zheng, Jian Yong Bian:
Using computer theory to detect PCB defects in an IoT environment. J. Supercomput. 78(17): 18887-18914 (2022)
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