"When Good Becomes Evil: Exploring Crosstalk Attack Surfaces on Multi-Port ..."

Tao Ni et al. (2025)

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DOI: 10.1109/TMC.2025.3587292

access: closed

type: Journal Article

metadata version: 2025-12-07

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Tao Ni, Zehua Sun, Yongliang Chen, Yihe Zhou, Jiayimei Wang, Weitao Xu, Qingchuan Zhao, Cong Wang:
When Good Becomes Evil: Exploring Crosstalk Attack Surfaces on Multi-Port USB Chargers. IEEE Trans. Mob. Comput. 24(12): 12950-12967 (2025)

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