"The Power of Precision: High-Resolution Backscatter Frequency Drift in ..."

Qingrui Pan et al. (2024)

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DOI: 10.1109/TMC.2023.3347681

access: closed

type: Journal Article

metadata version: 2024-08-02

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Qingrui Pan, Zhenlin An, Xiaopeng Zhao, Lei Yang:
The Power of Precision: High-Resolution Backscatter Frequency Drift in RFID Identification. IEEE Trans. Mob. Comput. 23(8): 8370-8385 (2024)

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