"An Efficient Deep Learning Paradigm for Deceit Identification Test on EEG ..."

Damodar Reddy Edla et al. (2021)

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DOI: 10.1145/3458791

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type: Journal Article

metadata version: 2023-03-21

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Damodar Reddy Edla, Shubham Dodia, Annushree Bablani, Venkatanareshbabu Kuppili:
An Efficient Deep Learning Paradigm for Deceit Identification Test on EEG Signals. ACM Trans. Manag. Inf. Syst. 12(3): 25:1-25:20 (2021)

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