"Exact scalable sensitivity analysis for the next release problem."

Mark Harman et al. (2014)

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DOI: 10.1145/2537853

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type: Journal Article

metadata version: 2022-01-03

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Mark Harman, Jens Krinke, Inmaculada Medina-Bulo, Francisco Palomo-Lozano, Jian Ren, Shin Yoo:
Exact scalable sensitivity analysis for the next release problem. ACM Trans. Softw. Eng. Methodol. 23(2): 19:1-19:31 (2014)

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