"Test Selection for Deep Learning Systems."

Wei Ma et al. (2021)

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DOI: 10.1145/3417330

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type: Journal Article

metadata version: 2022-06-23

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Wei Ma, Mike Papadakis, Anestis Tsakmalis, Maxime Cordy, Yves Le Traon:
Test Selection for Deep Learning Systems. ACM Trans. Softw. Eng. Methodol. 30(2): 13:1-13:22 (2021)

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