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"Extending integrated-circuit yield-models to estimate early-life reliability."
Thomas S. Barnett, Adit D. Singh, Victor P. Nelson (2003)
- Thomas S. Barnett, Adit D. Singh, Victor P. Nelson:
Extending integrated-circuit yield-models to estimate early-life reliability. IEEE Trans. Reliab. 52(3): 296-300 (2003)
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