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"Behavior of a radiation-immune CMOS logic family under resistive shorts."

Erik H. Ingermann, James F. Frenzel (1996)

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DOI: 10.1109/24.510801

access: closed

type: Journal Article

metadata version: 2020-07-09

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  - journals/tr/IngermannF96
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  - https://dblp.org/rec/journals/tr/IngermannF96
Erik H. Ingermann, James F. Frenzel:
Behavior of a radiation-immune CMOS logic family under resistive shorts. IEEE Trans. Reliab. 45(2): 194-199 (1996)

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