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"A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown ..."
Seong-Joon Kim, Tao Yuan, Suk Joo Bae (2016)
- Seong-Joon Kim, Tao Yuan, Suk Joo Bae:
A Spatio-Temporal Defect Process Model for Competing Progressive Breakdown Modes of Ultra-Thin Gate Oxides. IEEE Trans. Reliab. 65(1): 263-271 (2016)
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