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"Elimination of bipolar induced drain breakdown and single transistor latch ..."

Mamidala Jagadesh Kumar, Vikram Verma (2002)

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DOI: 10.1109/TR.2002.801851

access: closed

type: Journal Article

metadata version: 2020-07-09

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Mamidala Jagadesh Kumar, Vikram Verma:
Elimination of bipolar induced drain breakdown and single transistor latch in submicron PD SOI MOSFET. IEEE Trans. Reliab. 51(3): 367-370 (2002)

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