"Degradation Modeling With Long-Term Memory Considering Measurement Errors."

Yunfei Shao, Wujun Si (2023)

> Home

Details and statistics

DOI: 10.1109/TR.2021.3125958

access: closed

type: Journal Article

metadata version: 2023-03-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tr/ShaoS23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tr/ShaoS23
Yunfei Shao, Wujun Si:
Degradation Modeling With Long-Term Memory Considering Measurement Errors. IEEE Trans. Reliab. 72(1): 177-189 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.