"A Transistor-Level Probabilistic Approach for Reliability Analysis of ..."

Bodapati Srinivasu, K. Sridharan (2017)

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DOI: 10.1109/TR.2016.2642168

access: closed

type: Journal Article

metadata version: 2020-07-09

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Bodapati Srinivasu, K. Sridharan:
A Transistor-Level Probabilistic Approach for Reliability Analysis of Arithmetic Circuits With Applications to Emerging Technologies. IEEE Trans. Reliab. 66(2): 440-457 (2017)

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