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"Accelerated Degradation Test Planning Using the Inverse Gaussian Process."

Zhi-Sheng Ye et al. (2014)

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DOI: 10.1109/TR.2014.2315773

access: closed

type: Journal Article

metadata version: 2022-04-19

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Zhi-Sheng Ye, Liangpeng Chen, Loon Ching Tang, Min Xie:
Accelerated Degradation Test Planning Using the Inverse Gaussian Process. IEEE Trans. Reliab. 63(3): 750-763 (2014)

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