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"Evaluating Complexity, Code Churn, and Developer Activity Metrics as ..."

Yonghee Shin et al. (2011)

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DOI: 10.1109/TSE.2010.81

access: closed

type: Journal Article

metadata version: 2020-09-07

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  - https://dblp.org/rec/journals/tse/ShinMWO11
Yonghee Shin, Andrew Meneely, Laurie A. Williams, Jason A. Osborne:
Evaluating Complexity, Code Churn, and Developer Activity Metrics as Indicators of Software Vulnerabilities. IEEE Trans. Software Eng. 37(6): 772-787 (2011)

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