"Predicting Wafer-Lot Output Time With a Hybrid FCM-FBPN Approach."

Toly Chen (2007)

> Home

Details and statistics

DOI: 10.1109/TSMCB.2007.895364

access: closed

type: Journal Article

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tsmc/Chen07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tsmc/Chen07
Toly Chen:
Predicting Wafer-Lot Output Time With a Hybrid FCM-FBPN Approach. IEEE Trans. Syst. Man Cybern. Part B 37(4): 784-793 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.