"A Pattern Deformational Model and Bayes Error-Correcting Recognition System."

Wen-Hsiang Tsai, King-Sun Fu (1979)

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DOI: 10.1109/TSMC.1979.4310126

access: closed

type: Journal Article

metadata version: 2020-05-20

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Wen-Hsiang Tsai, King-Sun Fu:
A Pattern Deformational Model and Bayes Error-Correcting Recognition System. IEEE Trans. Syst. Man Cybern. 9(12): 745-756 (1979)

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