"Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier."

Innocent Agbo et al. (2017)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2016.2643618

access: closed

type: Journal Article

metadata version: 2020-03-11

- view
  authority control:
- export record
  dblp key:
  - journals/tvlsi/AgboTKHKWRC17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/AgboTKHKWRC17
Innocent Agbo, Mottaqiallah Taouil, Daniel Kraak, Said Hamdioui, Halil Kukner, Pieter Weckx, Praveen Raghavan, Francky Catthoor:
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier. IEEE Trans. Very Large Scale Integr. Syst. 25(4): 1444-1454 (2017)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.