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"ALADIN: a multilevel testability analyzer for VLSI system design."

Massimo Bombana et al. (1994)

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DOI: 10.1109/92.285743

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/BombanaBCFSZ94
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  - https://dblp.org/rec/journals/tvlsi/BombanaBCFSZ94
Massimo Bombana, Giacomo Buonanno, Patrizia Cavalloro, Fabrizio Ferrandi, Donatella Sciuto, Giuseppe Zaza:
ALADIN: a multilevel testability analyzer for VLSI system design. IEEE Trans. Very Large Scale Integr. Syst. 2(2): 157-171 (1994)

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