"Test data compression and test time reduction using an embedded ..."

Sungbae Hwang, Jacob A. Abraham (2003)

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DOI: 10.1109/TVLSI.2003.817140

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type: Journal Article

metadata version: 2020-03-11

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Sungbae Hwang, Jacob A. Abraham:
Test data compression and test time reduction using an embedded microprocessor. IEEE Trans. Very Large Scale Integr. Syst. 11(5): 853-862 (2003)

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